| Autor: |
Donovan, P., George, B., Bruson, A., Dufour, C., Marchal, G., Mangin, Ph. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2/1/1991, Vol. 69 Issue 3, p1371, 6p |
| Abstrakt: |
Discusses the interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers. Investigation of the structure and physical properties of silicon-based multilayers; Use of neutron diffraction, small-angle x-ray scattering and transmission electron microscopy to characterize the specimens; Experimental details and result of the study. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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