| Autor: |
Saulys, D., Rudd, G., Garfunkel, E. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2/1/1991, Vol. 69 Issue 3, p1707, 5p, 4 Black and White Photographs, 1 Diagram |
| Abstrakt: |
Presents a study that explained the defect creation and scanning tunneling electron microscopy-assisted surface etching process in a conducting oxide. Methodology; Features of the defects in the conducting oxide; Analysis of mechanism of structural changes in the surface pit shape of the conducting oxide. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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