| Autor: |
Yarmchuk, E. J., Keefe, G. E. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 12/1/1989, Vol. 66 Issue 11, p5435, 5p, 3 Diagrams, 4 Graphs |
| Abstrakt: |
Presents a study which developed a technique for making direct, quantitative measurements of surface charge distribution on photoconductors. Methods proposed for measuring charge distribution on photoconductor surfaces; Description of the technique in measuring of charge distribution on photoconductors; Measurement of the two-dimensional charge distributions on photoconductors. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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