Autor: |
Luborsky, F. E., Kwasnick, R. F., Borst, K., Garbauskas, M. F., Hall, E. L., Curran, M. J. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 12/1/1988, Vol. 64 Issue 11, p6388, 4p, 1 Black and White Photograph, 1 Chart, 2 Graphs |
Abstrakt: |
Presents a study that analyzed the thickness dependence of the properties of yttrium-barium-copper-oxide superconductor films. Methodology; Influence of film thickness on the critical currents of the superconductor films; Examination of the microstructure of the samples. |
Databáze: |
Complementary Index |
Externí odkaz: |
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