Transmission electron microscopy investigation of laser-induced defects in (Al, Ga) As.

Autor: Zysset, B., Salathé, R. P., Martin, J. L., Gotthardt, R., Reinhart, F. K.
Předmět:
Zdroj: Journal of Applied Physics; 12/1/1985, Vol. 58 Issue 11, p4089, 6p, 5 Black and White Photographs, 1 Diagram
Abstrakt: Presents a study which investigated transmission electron microscopy of laser-induced defects in (aluminum, gallium) arsenide. Method of the study; Results and discussion; Conclusion.
Databáze: Complementary Index