Transmission electron microscopy investigation of laser-induced defects in (Al, Ga) As.
Autor: | Zysset, B., Salathé, R. P., Martin, J. L., Gotthardt, R., Reinhart, F. K. |
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Zdroj: | Journal of Applied Physics; 12/1/1985, Vol. 58 Issue 11, p4089, 6p, 5 Black and White Photographs, 1 Diagram |
Abstrakt: | Presents a study which investigated transmission electron microscopy of laser-induced defects in (aluminum, gallium) arsenide. Method of the study; Results and discussion; Conclusion. |
Databáze: | Complementary Index |
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