| Autor: |
Hahn, D. W., Pettit, G. H., Ediger, M. N. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/1/1994, Vol. 76 Issue 3, p1830, 3p |
| Abstrakt: |
Deals with a study which observed the reflectivity measurements of polymide during argon fluoride excimer laser ablation using a unique posterior surface technique. Information on the possible mechanisms behind changes in the optical properties of organic materials; Examination of the reflectivity from thin polymer films; Evaluation of the characteristic changes occurring within the solid material. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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