| Autor: |
Nelson, A. J., Niles, D. W., Kazmerski, L. L., Rioux, D., Patel, R., Höchst, H. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/1/1992, Vol. 72 Issue 3, p976, 5p |
| Abstrakt: |
Presents a study that investigated the development of the electronic structure at the molybdenum/copper-indium-selenium interface. Use of synchrotron radiation soft-x-ray photoemission spectroscopy; Correlation of interface chemistry with electronic structure; Experimentation on photoemission. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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