Autor: |
He, L., Becker, C. R., Bicknell-Tassius, R. N., Scholl, S., Landwehr, G. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 4/1/1993, Vol. 73 Issue 7, p3305, 8p, 1 Black and White Photograph, 1 Diagram, 5 Graphs |
Abstrakt: |
Investigates the structural and electrical properties of (100) Hg[sub1-x]Cd[subx]Te epilayers grown by molecular beam epitaxy for Hg/Te flux ratios. Effects of Hg flux on pyramidal hillock density; Approach in carrying out epitaxial growth; Influence of the Hg/Te flux ratio during growth on the structural and electrical properties of narrow gap Hg[sub1-x]Cd[subx]Te. |
Databáze: |
Complementary Index |
Externí odkaz: |
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