| Autor: |
Pécz, B., Radnóczi, G., Horváth, Zs. J., Barna, P. B., Jároli, Erika, Gyulai, J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 4/1/1992, Vol. 71 Issue 7, p3408, 6p, 9 Black and White Photographs, 2 Graphs |
| Abstrakt: |
Provides information on a study that examined the effect of xenon and argon ion beam treatment and subsequent annealing on the gold/n-GaAs system using cross-sectional transmission electron microscopy. Methodology of the study; Results and discussion on the study. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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