| Autor: |
Feil, W. A., Wessels, B. W. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/15/1993, Vol. 74 Issue 6, p3927, 5p, 1 Chart, 6 Graphs |
| Abstrakt: |
Presents a study which investigated the electrical and optical properties of deep-level defects in strontium titanate thin films grown by organometallic chemical-vapor deposition. Discussion on the theory of transient photo-capacitance measurements; Transient photocapacitance response for a metal/insulator/semiconductor structure; Identification of extrinsic defects in the thin films. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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