A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes.

Autor: Dmowski, K., Lepley, B., Losson, E., Bouabdellati, M. El
Předmět:
Zdroj: Journal of Applied Physics; 9/15/1993, Vol. 74 Issue 6, p3936, 8p, 1 Chart, 12 Graphs
Abstrakt: Presents a study which proposed a method to determine the accurate values of deep level parameters in Schottky diodes. Implication of the numerical modeling of deep level transient spectroscopy (DLTS) signals; Theoretical analysis of the conventional DLTS model; Description of the DLTS signal with leakage current effect.
Databáze: Complementary Index