The effect of anodization on the electromigration drift velocity in aluminum films.

Autor: Ross, C. A., Drewery, J. S., Somekh, R. E., Evetts, J. E.
Předmět:
Zdroj: Journal of Applied Physics; 9/15/1989, Vol. 66 Issue 6, p2349, 7p, 3 Diagrams, 2 Charts, 3 Graphs
Abstrakt: Deals with a study which discussed the effect of the variation of diffusivity with stress on the stress distribution within a drifting thin-film sample. Experimental work; Results and discussion; Conclusion.
Databáze: Complementary Index