Al-related recombination center in polycrystalline Si.
Autor: | Rodot, M., Bourée, J. E., Mesli, A., Revel, G., Kishore, R., Pizzini, S. |
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Zdroj: | Journal of Applied Physics; 9/15/1987, Vol. 62 Issue 6, p2556, 3p |
Abstrakt: | Provides information on a study which investigated aluminum-related traps in polycrystalline silicon by deep-level transient spectroscopy and laser-beam-induced current measurements. Methods; Results; Discussion. |
Databáze: | Complementary Index |
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