Be+ ion implantation in Ga0.96Al0.04Sb epitaxial layers.

Autor: Pérotin, M., Gouskov, L., Luquet, H., Abiale Abi, P., Sabir, A., Pérez, A.
Předmět:
Zdroj: Journal of Applied Physics; 10/15/1990, Vol. 68 Issue 8, p3856, 5p, 2 Charts, 9 Graphs
Abstrakt: Presents a study which implanted beryllium ions into tellurium-doped Ga[sub0.96]Al[sub0.04]Sb epitaxial layers grown by liquid phase epitaxy. Experimental details; Results and discussion; Conclusion.
Databáze: Complementary Index