Charged particle activation analysis study of the oxygen outdiffusion from Czochralski-grown silicon during classical and rapid thermal annealing in various gas ambient.

Autor: Maddalon-Vinante, C., Barbier, D., Erramli, H., Blondiaux, G.
Předmět:
Zdroj: Journal of Applied Physics; 11/15/1993, Vol. 74 Issue 10, p6115, 5p, 4 Graphs
Abstrakt: Presents a study which examined the oxygen outdiffusion from Czochralski silicon under oxygen, nitrogen, argon and hydrogen atmospheres. Characteristics of oxygen outdiffusion in Czochralski-silicon wafers; Materials and methods; Description of oxygen in a sample submitted to the classical outdiffusion treatment; Description of the sample annealed in a hydrogenated ambient.
Databáze: Complementary Index