The temperature dependence of polycrystalline Si bulk and surface conductivity.

Autor: Alpern, Y., Shappir, J.
Předmět:
Zdroj: Journal of Applied Physics; 11/15/1988, Vol. 64 Issue 10, p4987, 6p, 2 Charts, 11 Graphs
Abstrakt: Discusses a study on temperature dependence of polycrystalline silicon conductivity. Correlation between activation energy and prefactor; Linear relation between the grain boundary potential barrier height and the temperature; Measurement of surface conductivity using field effects.
Databáze: Complementary Index