Measurement of Young’s moduli for film and substrate by the mechanical resonance method.
| Autor: | Lee, Y. H., Shin, Y. D., Lee, K. H., Rhee, J. R. |
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| Zdroj: | Journal of Applied Physics; 5/15/1994, Vol. 75 Issue 10, p5913, 3p, 2 Diagrams, 2 Charts, 1 Graph |
| Abstrakt: | Provides information on a study that used the mechanical resonance frequency method in measuring Young's moduli for thin films and substrate. Experimental procedure; Results and discussion on the study; Conclusion. |
| Databáze: | Complementary Index |
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