| Autor: |
Xiu, Lisong, Wu, Ziqin |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/15/1992, Vol. 71 Issue 10, p4892, 5p |
| Abstrakt: |
Presents information on a study which investigated the effects of the disorder of superlattice periods on x-ray diffraction patterns. Calculation of the diffraction profiles of semiconductor superlattices; Effect of systematic deviation of period on the width, position and the shape of superlattice peaks; Explanation of the effects of the local deviation. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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