| Autor: |
Hsu, J. W. P., Bahr, C. C., vom Felde, A., Downey, S. W., Higashi, G. S., Cardillo, M. J. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/15/1992, Vol. 71 Issue 10, p4983, 8p |
| Abstrakt: |
Presents information on a study which correlated photoconductivity with surface characterization in order to probe the influence of different surface properties of silicon on electron-hole dynamics. Lasers used in the photoconductivity studies; Information on the surface preparation and characterization; Discussion on effective lifetime and surface recombination velocity for different surfaces; Effect of sputter induced disorder. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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