Deposition and surface characterization of high quality single crystal GaN layers.

Autor: Asif Khan, M., Kuznia, J. N., Olson, D. T., Kaplan, R.
Předmět:
Zdroj: Journal of Applied Physics; 3/15/1993, Vol. 73 Issue 6, p3108, 3p, 2 Black and White Photographs, 1 Graph
Abstrakt: Presents a study which described the surface characterization of high quality gallium nitride layers grown by low pressure metalorganic chemical vapor deposition. Theoretical background; Computational approach; Findings.
Databáze: Complementary Index