| Autor: |
Bergner, H., Hempel, K., Krause, A., Stamm, U. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/15/1992, Vol. 71 Issue 6, p3010, 9p, 5 Black and White Photographs, 4 Diagrams, 6 Graphs |
| Abstrakt: |
Presents a study which demonstrated a pump and probe beam technique in conjunction with the optical-beam-induced current method of laser scanning microscopy. Benefits from the use of laser scanning microscopy; Limitation in the time resolution of the measurement; Basis for the method; Requirements for the development of highly integrated high-speed semiconductor devices. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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