| Autor: |
Teare, S. W., Fischer, C. W. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/15/1989, Vol. 65 Issue 6, p2479, 6p |
| Abstrakt: |
Examines the anodic oxidation of thin aluminum films on gallium arsenide beyond the exhaustion point using Rutherford scattering spectroscopy. Description of the triple-layer structure resulting from continued anodization; Measurement of the thickness and composition of the aluminum/gallium arsenide composite oxides; Discussion of results. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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