Small signal time-of-flight transients.
Autor: | Grunwald, H. P. |
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Předmět: | |
Zdroj: | Journal of Applied Physics; 3/15/1985, Vol. 57 Issue 6, p1985, 5p, 3 Graphs |
Abstrakt: | Investigates the behavior of a pulse shaped charge disturbance injected into a low-conductivity semiconductor in the presence of traps. Value of the time-of-flight technique in the transport phenomena in semiconductors; Expression for the small signal transient waveform; Overview of the multiple trapping model. |
Databáze: | Complementary Index |
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