| Autor: |
Mercer, T. W., Carroll, D. L., Liang, Y., DiNardo, N. J., Bonnell, D. A. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/15/1994, Vol. 75 Issue 12, p8225, 3p |
| Abstrakt: |
Presents a study that investigated photoinduced scanning tunneling microscopy (STM) of insulating diamond films. Use of scanning tunneling spectroscopy in probing the local electronic structure of illuminated insulating surfaces; Description of the polycrystalline diamond film used in the study; Effects of incoherent and coherent light incident on tunnel junctions in STM measurements. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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