Determination of the fluorine content in a-Si:H:F by infrared spectroscopy, electron probe microanalysis, x-ray photoelectron spectroscopy, and secondary ion mass spectrometry.

Autor: Langford, A. A., Fleet, M. L., Nelson, A. J., Asher, S. E., Goral, J. P., Mason, A.
Předmět:
Zdroj: Journal of Applied Physics; 6/15/1989, Vol. 65 Issue 12, p5154, 7p, 8 Graphs
Abstrakt: Presents a study which determined the fluorine content in a silicon:hydrogen:fluorine with 0%-10% fluorine by electron probe microanalysis, x-ray photoelectron spectroscopy, secondary ion mass spectrometry and infrared spectrometry. Methods; Results; Discussion.
Databáze: Complementary Index