| Autor: |
Tayag, Tristan J., Batchman, Theodore E., Sluss, James J. |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 7/15/1994, Vol. 76 Issue 2, p967, 7p |
| Abstrakt: |
Reports on the measurement of the photocarrier mobility of bismuth silicon oxide (BSO) through a time-of-flight technique. Ranges and mobilities of electrons in BSO; Data on the transient current response depicting anomalous transit time dispersion due to hopping; Experimental technique and results. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
