| Autor: |
Geha, Sam G., Carlile, Robert N., O’Hanlon, John F., Selwyn, Gary S. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 7/15/1992, Vol. 72 Issue 2, p374, 10p |
| Abstrakt: |
Presents information on a study which utilized a tuned Langmuir probe to measure the plasma potential of regions occupied by contamination particles. Role of negative charge on plasma particles; Experimental apparatus; Visual observation of particles using the helium-neon laser system; Conditions required for the traps to attract and maintain negatively charged particles. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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