Shape-memory properties in Ni-Ti sputter-deposited film.

Autor:	Busch, J. D., Johnson, A. D., Lee, C. H., Stevenson, D. A.
Předmět:	THIN films CRYSTALLIZATION X-ray diffraction
Zdroj:	Journal of Applied Physics; 12/15/1990, Vol. 68 Issue 12, p6224, 5p
Abstrakt:	Presents a study that established a shape-memory effect in sputter-deposited films of nickel titanium. Preparation of the alloy; Crystallization of amorphous films; Suitable annealing process; X-ray diffraction patterns.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu