Assessment of the structural quality of CdTe/Cd1-xZnxTe strained superlattices by high-resolution x-ray diffraction and photoluminescence studies.

Autor: Ponchet, A., Lentz, G., Tuffigo, H., Magnea, N., Mariette, H., Gentile, P.
Předmět:
Zdroj: Journal of Applied Physics; 12/15/1990, Vol. 68 Issue 12, p6229, 5p
Abstrakt: Presents a study that analyzed X-ray double-diffraction rocking-curve measurements and low temperature photoluminence spectroscopy of CdTe-Cd[sub1-x]Zn[subx]Te strained-layer superlattices grown by molecular beam epitaxy. Sharp satellite reflections; Composition and perpendicular stress; Reproducibility obtained from superlattices.
Databáze: Complementary Index