Secondary ion mass spectrometry depth profiling of proton-exchanged LiNbO3 waveguides.
| Autor: | Wilson, R. G., Novak, S. W., Zavada, J. M., Loni, A., De La Rue, R. M. |
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| Zdroj: | Journal of Applied Physics; 12/15/1989, Vol. 66 Issue 12, p6055, 4p, 1 Chart, 4 Graphs |
| Abstrakt: | Presents study which measured simultaneous depth profiles for hydrogen and lithium in proton-exchanged lithium niobate crystals. Experimental details; Results and discussion; Conclusion. |
| Databáze: | Complementary Index |
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