| Autor: |
Waytena, G. L., Hoff, H. A., Vold, C. L., Broussard, P. R., Claassen, J. H., Cestone, V. C., Sprague, J. A. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/15/1994, Vol. 76 Issue 4, p2380, 7p, 5 Black and White Photographs, 2 Graphs |
| Abstrakt: |
Presents a study that investigated the microstructure and composition of a YBa[sub2]Cu[sub3]O[sub7-x]/Y[sub2]O[sub3]/YBa[sub2]Cu[sub3]O[sub7-x] trilayer film deposited on manganese oxide. Deposition of the trilayer films; Initial characterization of the films; Interpretation of a cross-section transmission electron microscopy image and the corresponding electron diffraction pattern of the trilayer. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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