| Autor: |
Hamoudi, A., Ligeon, E., Cibert, J., Dang, Le Si, Tatarenko, S., Feuillet, G., Jouneau, P. H., Pautrat, J. L., Saminadayar, K. |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 8/15/1993, Vol. 74 Issue 4, p2524, 11p, 6 Black and White Photographs, 14 Graphs |
| Abstrakt: |
Presents a study which examined implantation-enhanced interdiffusion of CdTe-ZnTe strained heterostructures using photoluminescence channeling, transmission electron microscopy and secondary-ion-mass spectrometry. Details on studies of implantation-enhanced interdiffusion of semiconductor interfaces; Experimental conditions and samples; Implantation in bulk materials and heterostructures. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
