Infrared reflectance evaluation of chemically vapor deposited β-SiC films grown on Si substrates.

Autor: Holm, R. T., Klein, P. H., Nordquist, P. E. R.
Předmět:
Zdroj: Journal of Applied Physics; 8/15/1986, Vol. 60 Issue 4, p1479, 7p, 7 Graphs
Abstrakt: Presents information on a study that evaluated cubic SiC films grown by chemical vapor deposition on silicon substrates. Brief summary of the materials preparation; Calculation of infrared spectra for ideal SiC, in semi-infinite, thick-film, and thin-film forms; Calculation of spectra for films on semi-infinite and on slablike substrates and for free-standing films.
Databáze: Complementary Index