| Autor: |
Casey, M. Sean, Fahrenbruch, Alan L., Bube, Richard H. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 4/15/1987, Vol. 61 Issue 8, p2941, 6p, 2 Charts, 5 Graphs |
| Abstrakt: |
Focuses on a study which investigated the phenomena that occur at the surface of bulk polycrystalline zinc phosphide and at interfaces of zinc-phosphide-based devices. Factors that indicate that loss of phosphorus from a very thin surface region is sufficient to severely degrade diode characteristics; Result of surface photovoltage measurements; Properties that limit the ability of zinc phosphide to electronic devices. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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