| Autor: |
Ogale, S. B., Joshee, Rekha, Godbole, V. P., Kanetkar, S. M., Bhide, V. G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 4/15/1985, Vol. 57 Issue 8, p2915, 6p |
| Abstrakt: |
Presents a study that investigated ion-beam-induced and subsequent thermal transformations at the iron-silicon (Fe-Si) interface by using the technique of interface-sensitive conversion electron M&oumi;ssbauer spectroscopy. Background on the emergence of ion-beam mixing; Resistance-annealing curve for the as-deposited and ion-beam mixed Fe-Si composites; Effect of ion bombardment on the FeSi layer formed at the interface. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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