| Autor: |
Scofield, John H., Epworth, R. W., Tennant, D. M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 9/1/1989, Vol. 66 Issue 5, p2032, 5p, 2 Black and White Photographs, 2 Diagrams, 2 Graphs |
| Abstrakt: |
Analyzes measurements of the noise of thin-film indium conductors. Background on the experimentation procedures conducted on the liquid metal conductors, including sample fabrication and melting experiments; Reaction of the conductors at various levels of temperature; Results and discussion. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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