| Autor: |
Li, Jian, Strane, J. W., Russell, S. W., Hong, S. Q., Mayer, J. W., Marais, T. K., Theron, C. C., Pretorius, R. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 10/1/1992, Vol. 72 Issue 7, p2810, 7p, 6 Black and White Photographs, 2 Charts, 7 Graphs |
| Abstrakt: |
Presents a study which determined first phase formation in copper binary thin film systems with titanium, zirconium, magnesium, tin, palladium and platinum using transmission electron microscopy and Rutherford backscattering spectrometry (RBS). Materials and methods; Diffraction patterns during annealing of copper and magnesium. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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