Photoluminescence and Raman scattering investigations of implanted and thermally annealed InP.
Autor: | Olego, D. J., Serreze, H. B. |
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Předmět: | |
Zdroj: | Journal of Applied Physics; 9/1/1985, Vol. 58 Issue 5, p1979, 3p |
Abstrakt: | Deals with a study which demonstrated the photoluminescence and Raman scattering measurements to determine concentrations of free electrons at the surfaces of implanted samples. Methodology of the study; Results and discussion. |
Databáze: | Complementary Index |
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