Life cycle testing of Ba x Sr 1−x TiO 3 ferroelectric thin films in a tlinable microwave device.
| Autor: | Miranda, Felix A., Van Keuls, Fred W., Romanofsky, Robert R., Mueller, Carl H., Warner, Joseph D. |
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| Zdroj: | Integrated Ferroelectrics; Feb2001, Vol. 34 Issue 1-4, p247-254, 8p |
| Databáze: | Complementary Index |
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