Electron microscope study of electrically active impurity precipitate defects in silicon.
| Autor: | Cullis, A. G., Katz, L. E. |
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| Zdroj: | Philosophical Magazine (00318086); Dec1974, Vol. 30 Issue 6, p1419-1443, 25p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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