Transmission electron microscopy study of rf-sputtered (Bi,Pb)2 Sr2 Ca2 Cu3 Oy thin films on MgO substrates.

Autor: Guldeste, A., O'Connor, J.D., Eastell, C.J., Grovenor, C.R.M., Goringe, M.J.
Zdroj: Philosophical Magazine Letters; Sep1997, Vol. 76 Issue 3, p217-222, 6p
Databáze: Complementary Index