Characterization of self-patterned SrBi 2 Ta 2 O 9 thin films from photo-sensitive solutions.

Autor: Uchida, H., Soyama, N., Kageyama, K., Ogi, K., Scott, M. C., Cuchiaro, J. D., Derbenwick, G. F., Mcmillan, L. D., Paz De Araujo, C. A.
Zdroj: Integrated Ferroelectrics; Apr1997, Vol. 16 Issue 1-4, p41-52, 12p
Databáze: Complementary Index