Analysis of the degradation of PZT and SrBi 2 Ta 2 O 9 thin films with a reductive process.
| Autor: | Hase, Takashi, Noguchi, Takehiro, Miyasaka, Yoichi |
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| Zdroj: | Integrated Ferroelectrics; Apr1997, Vol. 16 Issue 1-4, p29-40, 12p |
| Databáze: | Complementary Index |
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