Infared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films.
| Autor: | Webb, J. D., Moutinho, H. R., Kazmerski, L. L., Mueller, C. H., Rivkin, T. V., Treece, R. E., Dalberth, M., Roger, C. T. |
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| Zdroj: | Integrated Ferroelectrics; Feb1997, Vol. 15 Issue 1-4, p9-18, 10p |
| Databáze: | Complementary Index |
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