A model of voltage-dependent dielectric losses for ferroelectric MMIC devices.
| Autor: | Scott, J. F., Galt, David, Price, John C., Beall, James A., Ono, Ronald H., Paz de Araujo, Carlos A., McMillan, L. D. |
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| Zdroj: | Integrated Ferroelectrics; Jan1995, Vol. 6 Issue 1-4, p189-203, 15p |
| Databáze: | Complementary Index |
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