Degradation of ferroelectric thin films: A defect chemistry approach.
| Autor: | Raymond, M. V., Chen, J., Smyth, D. M. |
|---|---|
| Zdroj: | Integrated Ferroelectrics; Sep1994, Vol. 5 Issue 1, p73-78, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Raymond, M. V., Chen, J., Smyth, D. M. |
|---|---|
| Zdroj: | Integrated Ferroelectrics; Sep1994, Vol. 5 Issue 1, p73-78, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|