Atomic Force Microscopy (AFM).
Autor: | Friedbacher, Gernot, Bubert, Henning |
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Zdroj: | Surface & Thin Film Analysis; 2011, p443-464, 22p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Friedbacher, Gernot, Bubert, Henning |
---|---|
Zdroj: | Surface & Thin Film Analysis; 2011, p443-464, 22p |
Databáze: | Complementary Index |
Externí odkaz: |