Frontmatter.
| Autor: | Tewksbury, Stuart K., Brewer, Joe E., Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Suñé, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D. |
|---|---|
| Zdroj: | Reliability Wearout Mechanisms in Advanced CMOS Technologies; 2009, pi-xv, 14p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|