Low-temperature epitaxy of Si and Ge by direct ion beam deposition.

Autor: Zuhr, R. A., Appleton, B. R., Herbots, N., Larson, B. C., Noggle, T. S., Pennycook, S. J.
Zdroj: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1987, Vol. 5 Issue 4, p2135-2139, 5p
Databáze: Complementary Index