Enabling technologies for forming and contacting shallow junctions in Si: HF-vapor cleaning and selective epitaxial growth of Si and SiGe.
Autor: | Raaijmakers, Ivo J., Sprey, Hessel, Storm, Arjen, Bergman, Timo, Italiano, Joe, Meyer, Doug |
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Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1999, Vol. 17 Issue 5, p2311-2320, 10p |
Databáze: | Complementary Index |
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